Denis Fougerouse

Denis Fougerouse is a structural and economic geologist with multiscale research interests, from large scale ore systems and fluid flows to the nanochemistry of minerals. He is at the fore of research using atom probe microscopy in the emerging field of the nanogeoscience. He has expertise in other advanced characterisation technics such as XFM mapping using the Maia detector, NanoSIMS, EBSD and nano-manufacturing using FIB-SEM.

He is currently a key member of the Geoscience Atom Probe facility which aims to develop new application of atom probe microscopy to the geoscience.